IEEE International Symposium on VLSI Design, Automation and Testで論文を発表します（8/13, 2020）

Yoshiki Kakuta, Reika Kinoshita, Hiroshi Kinoshita, Chihiro Matsui and Ken Takeuchi, “Real-time Error Monitoring System Considering Endurance and Data-retention Characteristics of TaOX-based ReRAM Storage with Workloads at Data Centers,” IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT), August 13, 2020.