IEEE Silicon Nanoelectronics Workshop (SNW)で論文を発表（6/8, 2025）

Shota Suzuki, Naoko Misawa, Chihiro Matsui and Ken Takeuchi, “Observation of State Change in 40nm TaOx ReRAM Cells during Read-disturb,” IEEE Silicon Nanoelectronics Workshop (SNW), June 8, 2025.