2020.06.05
Chihiro Matsui, Shun Suzuki and Ken Takeuchi, “Spatial Color-Perceived Data Control of NAND Flash for Image Detection,” IEEE Silicon Nanoelectronics Workshop (SNW), June 13-14, 2020.
Shun Suzuki, Hiroki Aihara, Keita Mizushina, Shin Yamaguchi and Ken Takeuchi, “Approximate 3D-TLC NAND Flash Write with Initial Error Injection for Application-level Reliability Improvement of Machine Learning-based Computing,” IEEE Silicon Nanoelectronics Workshop (SNW), June 13-14, 2020.
Keita Mizushina, Shun Suzuki, Hiroki Aihara and Ken Takeuchi, “3840x Reliability Enhanced Robust NAND flash Optimized to Store Weight Data for Object Detection and Semantic Segmentation of Self-driving Car at High Temperature,” IEEE Silicon Nanoelectronics Workshop (SNW), June 13-14, 2020.