Journal Publication at IEICE Transactions on Electronics（July 1, 2023）

Shinsei Yoshikiyo, Naoko Misawa, Kasidit Toprasertpong, Shinichi Takagi, Chihiro Matsui and Ken Takeuchi, “Write Variation & Reliability Error Compensation by Layer-wise Tunable Retraining of Edge FeFET LM-GA CiM,” IEICE Transactions on Electronics, vol. E106-C, no. 7, pp. 352-364, July, 2023.