Two Conference Presentations at IEEE International Reliability Physics Symposium (IRPS)（April 3, 2025）

Kenshin Yamauchi, Naoko Misawa, Hisashi Shima, Yasuhisa Naitoh, Hiroyuki Akinaga, Chihiro Matsui and Ken Takeuchi, “Read Voltage Dependency of Random Telegraph Noise in the Intermediate State of TaOx-based ReRAM,” IEEE International Reliability Physics Symposium (IRPS), April 3, 2025.

Kenshin Yamauchi, Naoko Misawa, Satoshi Awamura, Masahiro Morimoto, Chihiro Matsui and Ken Takeuchi, “Conductance Variation-Assisted Adversarial Attack Robustness on 40nm TaOX-based ReRAM CiM,” IEEE International Reliability Physics Symposium (IRPS), April 3, 2025.