Conference Presentation at IEEE International Memory Workshop（May 18-20, 2020）

Masaki Abe, Chihiro Matsui, Keita Mizushina, Shun Suzuki and Ken Takeuchi, “Computational Approximate Storage with Neural Network-based Error Patrol of 3D-TLC NAND Flash Memory for Machine Learning Applications,” IEEE International Memory Workshop Poster, May 20, 2020.

Yusaku Hine, Reika Kinoshita, Yoshiki Kakuta and Ken Takeuchi, “Data Allocation Algorithm based on Write and Read Frequency for Double Asymmetric-latency SCM SSD,” IEEE International Memory Workshop Poster, May 20, 2020.

Hiroki Aihara, Kyosuke Maeda, Shun Suzuki and Ken Takeuchi, “Extremely Biased Error Correction Method to Reduce Read Disturb Errors of 3D-TLC NAND Flash Memories by 60%,” IEEE International Memory Workshop Poster, May 18, 2020.