JournalPapers_008

Ken Takeuchi, Shinji Satoh, Tomoharu Tanaka, Ken-ichi Imamiya, and Koji Sakui, “A Negative Vth Cell Architecture for Highly Scalable, Excellently Noise-Immune, and Highly Reliable NAND Flash Memories,” IEEE J. of Solid-State Circuits, vol. 34, no. 5, pp. 675-684, June 1999.

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