JournalPapers_023

Shuhei Tanakamaru, Mayumi Fukuda, Kazuhide Higuchi, Atsushi Esumi, Mitsuyoshi Ito, Kai Li and Ken Takeuchi, “Post-manufacturing, 17-times Acceptable Raw Bit Error Rate Enhancement, Dynamic Codeword Transition ECC Scheme for Highly Reliable Solid-State Drives, SSDs,” Solid-State Electronics, vol. 58, no. 1, pp. 2-10, April 2011.

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