JournalPapers_018

Teruyoshi Hatanaka, Ryoji Yajima, Mitsue Takahashi, Shigeki Sakai and Ken Takeuchi, “A Negative Word-line Voltage Negatively-Incremental Erase Pulse Scheme with ΔVTH=1/6 ΔVERASE for Enterprise Solid-State Drive (SSD) Application Ferroelectric (Fe)-NAND Flash Memories,” Japanese Journal of Applied Physics (JJAP),vol. 49, no.4, pp. 04DD08-04DD13, April 2010.

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