JournalPapers_093

Yoshiaki Deguchi, Toshiki Nakamura, Atsuna Hayakawa and Ken Takeuchi, “3-D NAND Flash Value-Aware SSD: Error-Tolerant SSD Without ECCs for Image Recognition,” IEEE J. of Solid-State Circuits, vol. 54, no. 6, pp. 1800-1811, March 2019.

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