JournalPapers_092

Toshiki Nakamura, Yoshiaki Deguchi and Ken Takeuchi, “Adaptive Artificial Neural Network-Coupled LDPC ECC as Universal Solution for 3-D and 2-D, Charge-Trap and Floating-Gate NAND Flash Memories,” IEEE J. of Solid-State Circuits, vol. 54, no. 3, pp. 745-754, March 2019.

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