JournalPapers_091

Yoshiaki Deguchi, Shun Suzuki and Ken Takeuchi, “Write and Read Frequency-Based Word-Line Batch VTH Modulation for 2D and 3D-TLC NAND Flash Memories,” IEEE J. of Solid-State Circuits, vol. 53, no. 10, pp. 2917-2926, October 2018.

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