JournalPapers_090

Hikaru Watanabe, Yoshiaki Deguchi, Atsuro Kobayashi, Chihiro Matsui and Ken Takeuchi, “System-level Read Disturb Suppression Techniques of TLC NAND Flash Memories for Read-Hot/Cold Data Mixed Applications,” Solid-State Electronics, vol. 147, pp. 63-77, September 2018.

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