JournalPapers_087

Yusuke Yamaga, Chihiro Matsui, Yukiya Sakaki and Ken Takeuchi, “Reliability Analysis of Scaled NAND Flash Memory based SSDs with Real Workload Characteristics by Using Real Usage-Based Precise Reliability Test,” IEICE Transactions on Electronics, vol. E101-C, no. 4, pp. 243-252, April 2018.

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