JournalPapers_078

Masafumi Doi, Tsukasa Tokutomi, Shogo Hachiya, Atsuro Kobayashi, Shuhei Tanakamaru, Sheyang Ning, Tomoko Ogura Iwasaki and Ken Takeuchi, “Quick-Low-Density Parity Check (LDPC) and Dynamic Threshold Voltage (VTH) Optimization in 1Xnm Triple-Level Cell (TLC) NAND Flash Memory with Comprehensive Analysis of Endurance, Retention-Time and Temperature Variation,” Japanese Journal of Applied Physics (JJAP), vol. 55, no. 8, 084201, July 2016.

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