JournalPapers_075

Senju Yamazaki, Tomoko Ogura Iwasaki, Shogo Hachiya, Tomonori Takahashi and Ken Takeuchi, “A 72% Error Reduction Scheme Based on Temperature Acceleration for Long-Term Data Storage Applications: Cold Flash and Millennium Memories,” Solid-State Electronics, vol. 121, pp.25-33, July 2016.

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