JournalPapers_071

Sheyang Ning, Tomoko Ogura Iwasaki, Shogo Hachiya, Glen Rosendale, Monte Manning, Darlene Viviani, Thomas Rueckes and Ken Takeuchi, “Carbon Nanotube Memory Cell Array Program Error Analysis and Tradeoff between Reset Voltage and Verify Pulses,” Japanese Journal of Applied Physics (JJAP), vol. 55, no. 4S, 04EE01, February 2016.

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