JournalPapers_070

Shuhei Tanakamaru, Shogo Hosaka, Koh Johguchi, Hirofumi Takishita and Ken Takeuchi, “Understanding Relation Between Performance and Reliability of NAND Flash / SCM Hybrid Solid-State Drive (SSD),” IEEE Transactions on VLSI Systems, vol. 24, no. 6, pp. 2208 – 2219, June 2016.

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