JournalPapers_063

Shuhei Tanakamaru, Hiroki Yamazawa, Tsukasa Tokutomi, Sheyang Ning and Ken Takeuchi, “Design Methodology for Highly Reliable, High Performance ReRAM and 3-bit/cell MLC NAND Flash Solid-State Storage,” IEEE Transactions on Circuits and Systems I, vol. 62, no. 3, pp. 844-853, March 2015.

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