JournalPapers_061

Shuhei Tanakamaru, Masafumi Doi and Ken Takeuchi, “A Design Strategy of Error-Prediction Low-Density Parity-Check (EP-LDPC) Error-Correcting Code (ECC) and Error-Recovery Schemes for Scaled NAND Flash Memories,” IEICE Transactions on Electronics, vol. E98-C, vol. 1, pp. 53-61, 2015.

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