Tomoko Ogura Iwasaki, Sheyang Ning and Ken Takeuchi, “Forward and Reverse Biasing in Resistive Memories for Fast, Disturb-Free Read, and Verify,”Japanese Journal of Applied Physics (JJAP), vol. 52, 04CD12, April 2013.
Tomoko Ogura Iwasaki, Sheyang Ning and Ken Takeuchi, “Forward and Reverse Biasing in Resistive Memories for Fast, Disturb-Free Read, and Verify,”Japanese Journal of Applied Physics (JJAP), vol. 52, 04CD12, April 2013.
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