JournalPapers_042 Posted 2020年3月30日 by master Tomoko Ogura Iwasaki, Sheyang Ning and Ken Takeuchi, “Forward and Reverse Biasing in Resistive Memories for Fast, Disturb-Free Read, and Verify,”Japanese Journal of Applied Physics (JJAP), vol. 52, 04CD12, April 2013.
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