JournalPapers_035

Kousuke Miyaji, Chinglin Hung and Ken Takeuchi, “Scaling Trends and Tradeoffs between Short Channel Effect and Channel Boosting Characteristics in sub-20nm Bulk/SOI NAND Flash Memory,” Japanese Journal of Applied Physics (JJAP), vol. 51, no. 4, pp. 04DD12, April 2012.

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