InternationalConference_227

Toshiki Nakamura, Shun Suzuki and Ken Takeuchi, “Data Pattern & Memory Variation Aware Fine-Grained ECC Optimized by Neural Network for 3D-TLC NAND Flash Memories with 2.0x Data-retention Time Extension and 30% Parity Overhead Reduction,” IEEE International Memory Workshop, May 2019.

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