Shouhei Fukuyama, Shinpei Matsuda, Ryutaro Yasuhara and Ken Takeuchi, “Improvement of Endurance and Data-retention in 40nm TaOX-based ReRAM by Finalize Verify,” IEEE Non-Volatile Memory Technology Symposium (NVMTS) Poster, October 2018
Shouhei Fukuyama, Shinpei Matsuda, Ryutaro Yasuhara and Ken Takeuchi, “Improvement of Endurance and Data-retention in 40nm TaOX-based ReRAM by Finalize Verify,” IEEE Non-Volatile Memory Technology Symposium (NVMTS) Poster, October 2018
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