InternationalConference_211

Yusuke Yamaga, Yoshiaki Deguchi, Shouhei Fukuyama and Ken Takeuchi, “5x Reliability Enhanced 40nm TaOx Approximate-ReRAM with Domain-Specific Computing for Real-time Image Recognition of IoT Edge Devices,” IEEE Symp. on VLSI Technology, pp. 109-110, June 20, 2018.

filed under: