InternationalConference_201

Toshiki Nakamura, Yoshiaki Deguchi and Ken Takeuchi, “9.1x Error Acceptable Adaptive Artificial Neural Network Coupled LDPC ECC for Charge-trap and Floating-gate 3D-NAND Flash Memories,” IEEE Custom Integrated Circuits Conference (CICC), pp. 1-4, April 10, 2018.

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