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Shun Suzuki, Yoshiaki Deguchi, Toshiki Nakamura, Kyoji Mizoguchi and Ken Takeuchi, “Cross Error Elimination ECC by Horizontal Error Detection and Vertical-LDPC ECC to Increase Data-Retention Time by 230% and Acceptable Bit-Error Rate by 90% for 3D-NAND Flash SSDs,” IEEE International Reliability Physics Symposium (IRPS) Poster, P-MY.7-1 – P-MY.7-4, March 2018.

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