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Shouhei Fukuyama, Kazuki Maeda, Ryutaro Yasuhara, Shinpei Matsuda and Ken Takeuchi, “Suppression of Endurance-stressed Data-retention Failures of 40nm TaOx-based ReRAM,” IEEE International Reliability Physics Symposium (IRPS) Poster, P-MY.4-1 – P-MY.4-5, March 2018.

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