InternationalConference_189

Yoshiaki Deguchi, Atsuro Kobayashi, Hikaru Watanabe and Ken Takeuchi, “Flash Reliability Boost Huffman Coding (FRBH): Co-Optimization of Data Compression and VTH Distribution Modulation to Enhance Data-Retention Time by over 2900x,” IEEE Symp. on VLSI Technology, pp. 206-207, June 8, 2017.

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