InternationalConference_184

Yoshiaki Deguchi, Toshiki Nakamura, Atsuro Kobayashi and Ken Takeuchi, “12x Bit-Error Acceptable, 300x Extended Data-Retention Time, Value-Aware SSD with Vertical 3D-TLC NAND Flash Memories for Image Recognition,” IEEE Custom Integrated Circuits Conference (CICC), May 1, 2017.

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