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Seiichi Aritome, Tomonori Takahashi, Kyoji Mizoguchi and Ken Takeuchi, “RTN Impact on Data-Retention Failure/Recovery in Scaled (~1Ynm) TLC NAND Flash Memories,” IEEE International Reliability Physics Symposium (IRPS) Poster, pp.PM-13.1-PM-13.4, April 5, 2017.

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