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Atsuro Kobayashi, Hikaru Watanabe, Yukiya Sakaki, Seiichi Aritome and Ken Takeuchi, “Investigation of Read Disturb Error in 1Ynm NAND Flash Memories for System Level Solution,” IEEE International Reliability Physics Symposium (IRPS) Poster, pp. PM-6.1-PM-6.4, April 5, 2017.

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