InternationalConference_168

Takashi Inose, Tomoko Ogura Iwasaki, Sheyang Ning, Darlene Viviani, Monte Manning, X. M. Henry Huang, Thomas Rueckes and Ken Takeuchi, “Reliability Study of Carbon Nanotube Memory after Various Cycling Conditions,” Silicon Nanoelectronics Workshop (SNW) Poster, pp. P1-17, June 12-13, 2016.

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