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Atsuro Kobayashi, Tsukasa Tokutomi and Ken Takeuchi, “Versatile TLC NAND Flash Memory Control to Reduce Read Disturb Errors by 85% and Extend Read Cycles by 6.7-times of Read-Hot and Cold Data for Cloud Data Centers,” IEEE Symp. on VLSI Technology, pp. 126-127, June 16, 2016.

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