Yoshio Nakamura, Tomoko Iwasaki and Ken Takeuchi, “Machine Learning-Based Proactive Data Retention Error Screening in 1Xnm TLC NAND Flash,” IEEE International Reliability Physics Symposium (IRPS) Poster, pp.PR-3-1-PR-3-4, April 2016.
Yoshio Nakamura, Tomoko Iwasaki and Ken Takeuchi, “Machine Learning-Based Proactive Data Retention Error Screening in 1Xnm TLC NAND Flash,” IEEE International Reliability Physics Symposium (IRPS) Poster, pp.PR-3-1-PR-3-4, April 2016.
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