InternationalConference_139

Tsukasa Tokutomi, Masafumi Doi, Shogo Hachiya, Atsuro Kobayashi, Shuhei Tanakamaru and Ken Takeuchi, “Enterprise-Grade 6× Fast Read and 5× Highly Reliable SSD with TLC NAND-Flash Memory for Big-Data Storage,” IEEE International Solid-State Circuits Conference (ISSCC), pp. 140-141, February 2015.

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