InternationalConference_134

Hiroki Yamazawa, Sheyang Ning, Tomoko Ogura Iwasaki, Shuhei Tanakamaru, Koh Johguchi and Ken Takeuchi, “50 nm AlxOy ReRAM Array Retention Characteristics Before and After Endurance,” Silicon Nanoelectronics Workshop (SNW) Poster, June 2014.

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