InternationalConference_108

Masafumi Doi, Shuhei Tanakamaru and Ken Takeuchi, “An Optimum Asymmetric Coding Strategy to Improve Program-Disturb Error in 2X, 3X and 4Xnm NAND Flash Memories for Highly Reliable Enterprise Solid-State Drives (SSDs),” Silicon Nanoelectronics Workshop (SNW), pp.7-8, June 2013.

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