InternationalConference_101

Shuhei Tanakamaru, Masafumi Doi and Ken Takeuchi, “Error-Prediction Analyses in 1X, 2X and 3Xnm NAND Flash Memories for System-Level Reliability Improvement of Solid-State Drives (SSDs),” IEEE International Reliability Physics Symposium (IRPS), 3B.3.1-3B.3.6, April 2013.

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