InternationalConference_076

Kousuke Miyaji, Toshikazu Suzuki, Shinji Miyano and Ken Takeuchi, “A 6T-SRAM with a Carrier Injection Scheme to Pinpoint and Repair Fails that Achieves 57% Faster Read and 31% Lower Read Energy,” IEEE International Solid-State Circuits Conference (ISSCC), pp. 232-233, February 2012.

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