InternationalConference_067

Kazuhide Higuchi, Kousuke Miyaji, Koh Johguchi and Ken Takeuchi, “50nm HfO2 ReRAM with 50-Times Endurance Enhancement by Set/Reset Turnback Pulse & Verify Scheme,” International Conference on Solid State Devices and Materials (SSDM), pp. 1101-1102, September 2011.

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