InternationalConference_064

Mitsue Takahashi, Xizhen Zhang, Le Van Hai, Kang Yan, Wei Zhang, Kousuke Miyaji, Ken Takeuchi and Shigeki Sakai, “NAND Flash Memory by Ferroelectric-Gate Field -Effect-Transistor Integration,” International Symposium on Integrated Functionalities (ISIF), August 2011.

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