InternationalConference_038

Ryoji Yajima, Teruyoshi Hatanaka, Mitsue Takahashi, Shigeki Sakai and Ken Takeuchi, “A Negative Word-line Voltage Step-Down Erase Pulse Scheme with ΔVTH=1/6 ΔVERASE for Enterprise SSD Application Ferroelectric (Fe)-NAND Flash Memories,” pp.1196-1197, International Conference on Solid State Devices and Materials (SSDM), October 2009.

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