InternationalConference_010

Ken Takeuchi, Shinji Satoh, Tomoharu Tanaka, Ken-ichi Imamiya, and Koji Sakui, “A Negative Vth Cell Architecture for Highly Scalable, Excellently Noise-Immune, and Highly Reliable NAND Flash Memories,” IEEE Symp. on VLSI Circuits, pp. 234-235, June 1998.

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