DomesticConference_196

Tomoko Ogura Iwasaki, Sheyang Ning, Hiroki Yamazawa, Chao Sun, Shuhei Tanakamaru, Ken Takeuchi, “ReRAM reliability characterization and improvement by machine learning”, 集積回路研究会, 信学技報, vol. 116, no. 3, ICD2016-4, pp. 39-44, 2016年4月14日.

filed under: